IEC 60748-22-1997 半导体器件集成电路第22部分:实行能力批准程序的膜集成电路和混合膜集成电路分规范
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【英文标准名称】:Semiconductordevices-Integratedcircuits-Part22:Sectionalspecificationforfilmintegratedcircuitsandhybridfilmintegratedcircuitsonthebasisofthecapabilityapprovalprocedures
【原文标准名称】:半导体器件集成电路第22部分:实行能力批准程序的膜集成电路和混合膜集成电路分规范
【标准号】:IEC60748-22-1997
【标准状态】:现行
【国别】:国际
【发布日期】:1997-04
【实施或试行日期】:
【发布单位】:国际电工委员会(IEC)
【起草单位】:IEC/SC47A
【标准类型】:()
【标准水平】:()
【中文主题词】:半导体器件;混合薄膜集成电路;混合集成电路;集成电路;膜集成电路;电子工程;电子设备及元件;分规范;薄膜电路;能力鉴定
【英文主题词】:
【摘要】:Thissectionalspecificationappliestofilmintegratedcircuitsandhybridfilmintegratedcircuitsmanufacturedascataloguecircuitsorascustom-builtcircuitswhosequalityisassessedonthebasisofcapabilityapproval.Theobjectofthisspecificationistopresentpreferredvaluesforratingsandcharacteristics,toselectfromthegenericspecificationtheappropriatetestsandmeasuringmethods,andtogivegeneralperformancerequirementstobeusedindetailspecificationsforfilmintegratedcircuitsandhybridfilmintegratedcircuitsderivedfromthisspecification.Theconceptofpreferredvaluesisdirectlyapplicabletocataloguecircuitsbutdoesnotnecessarilyapplytocustombuiltcircuits.Testseveritiesandrequirementsprescribedindetailspecificationsreferringtothissectionalspecificationareofequalorhigherperformancelevel,sincelowerperformancelevelsarenotpermitted.Associatedwiththisspecificationareoneormoreblankdetailspecifications,eachreferencedbyanIECnumber.Ablankdetailspecificationwhichhasbeencompletedasspecifiedin2.3ofthisspecification,formsadetailspecification.Suchdetailspecificationsareusedfortheacceptanceofacompletecircuit,andthegrantingofcapabilityapprovalfortheboundariesofcapabilityidentifiedbythemanufacturerinhiscapabilitymanualandmaintenanceofcapabilityapprovalinaccordancewiththeIECQsystem.NOTE-Fortestprocedurestwoalternativesareavailable:MethodAormethodB;however,itisnotpermittedtochangethemethodsbetweentestsofmethodA,respectivelyB.Ingeneral,methodAismoresuitableforpassivecomponentbasedfilmintegratedcircuits,whereasmethodBismoreapplicabletosemiconductorintegratedcircuittechnologybasedfilmintegratedcircuits.
【中国标准分类号】:L56
【国际标准分类号】:31_200
【页数】:121P;A4
【正文语种】:英语
【原文标准名称】:半导体器件集成电路第22部分:实行能力批准程序的膜集成电路和混合膜集成电路分规范
【标准号】:IEC60748-22-1997
【标准状态】:现行
【国别】:国际
【发布日期】:1997-04
【实施或试行日期】:
【发布单位】:国际电工委员会(IEC)
【起草单位】:IEC/SC47A
【标准类型】:()
【标准水平】:()
【中文主题词】:半导体器件;混合薄膜集成电路;混合集成电路;集成电路;膜集成电路;电子工程;电子设备及元件;分规范;薄膜电路;能力鉴定
【英文主题词】:
【摘要】:Thissectionalspecificationappliestofilmintegratedcircuitsandhybridfilmintegratedcircuitsmanufacturedascataloguecircuitsorascustom-builtcircuitswhosequalityisassessedonthebasisofcapabilityapproval.Theobjectofthisspecificationistopresentpreferredvaluesforratingsandcharacteristics,toselectfromthegenericspecificationtheappropriatetestsandmeasuringmethods,andtogivegeneralperformancerequirementstobeusedindetailspecificationsforfilmintegratedcircuitsandhybridfilmintegratedcircuitsderivedfromthisspecification.Theconceptofpreferredvaluesisdirectlyapplicabletocataloguecircuitsbutdoesnotnecessarilyapplytocustombuiltcircuits.Testseveritiesandrequirementsprescribedindetailspecificationsreferringtothissectionalspecificationareofequalorhigherperformancelevel,sincelowerperformancelevelsarenotpermitted.Associatedwiththisspecificationareoneormoreblankdetailspecifications,eachreferencedbyanIECnumber.Ablankdetailspecificationwhichhasbeencompletedasspecifiedin2.3ofthisspecification,formsadetailspecification.Suchdetailspecificationsareusedfortheacceptanceofacompletecircuit,andthegrantingofcapabilityapprovalfortheboundariesofcapabilityidentifiedbythemanufacturerinhiscapabilitymanualandmaintenanceofcapabilityapprovalinaccordancewiththeIECQsystem.NOTE-Fortestprocedurestwoalternativesareavailable:MethodAormethodB;however,itisnotpermittedtochangethemethodsbetweentestsofmethodA,respectivelyB.Ingeneral,methodAismoresuitableforpassivecomponentbasedfilmintegratedcircuits,whereasmethodBismoreapplicabletosemiconductorintegratedcircuittechnologybasedfilmintegratedcircuits.
【中国标准分类号】:L56
【国际标准分类号】:31_200
【页数】:121P;A4
【正文语种】:英语
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